Technical Talks
This year, as a new feature at SAAEI, technical talks by exhibitors will run in parallel with the technical sessions of the congress.
Wednesday - July 8
📍 Barlovento Hall | 🕒 17:30 - 19:00
17:30 – 18:00
Kolbi
Thursday - July 9
📍 Barlovento Hall | 🕒 17:30 - 19:00
17:30 – 18:00
Rohde & Schwarz
18:30 – 19:00
Vertiv
Friday - July 10
📍 Barlovento Hall | 🕒 11:30 - 12:30
11:30 – 12:00
MathWorks
Detailed information about each technical talk will be published soon.
Instrumentation for the development and validation of electronic systems: challenges and opportunities in the era of AI
📍 Barlovento Hall | 🗓️ Wednesday, July 8 🕒 18:30
Daniel Puentes 
Daniel Puentes is Sales Director at Datatec Instruments. He holds a degree in Industrial Engineering from the Technical University of Madrid (UPM) and has over 12 years of experience in the electronic test and measurement instrumentation sector. Throughout his career, he has worked closely with research centers, universities, and industrial companies in projects related to radiofrequency, electromagnetic compatibility (EMC), power electronics, and electronic device characterization.
His experience, along with knowledge of a broad portfolio of leading instrumentation manufacturers, allows him to help engineers select and apply the most suitable measurement solutions for their development, testing, and validation challenges.
The increasing complexity of modern electronic systems, driven by the adoption of wide-bandgap semiconductors (SiC and GaN), the electrification of multiple industrial sectors, and the digitalization of development processes, presents new challenges in design, validation, and certification stages.
This talk presents a practical overview of the most relevant trends in electronic instrumentation applied to power converter development, high-speed electronic systems, and advanced industrial applications. It addresses the main challenges associated with SiC and GaN device characterization, including high-speed signal measurement, dynamic switching losses, parasitic phenomena, and power integrity.
It also discusses the role of EMC pre-compliance techniques as a tool to reduce risks and costs during the design process, showing measurement strategies that help identify and correct emission and immunity issues before final certification. Finally, it explores how artificial intelligence (AI) is beginning to be integrated into modern instrumentation to speed up result interpretation, automate measurement processes, and assist engineers in complex diagnostic and characterization tasks. The talk combines technical fundamentals with practical examples of instrumentation selection and real-world applications, providing a current view of how smart instrumentation is transforming the development of future electronic systems. During SAAEI 2026, Datatec will offer live demonstrations of instruments from Keysight, Tektronix, Keithley, Elektro Automatik, Siglent, emiGo, and PicoTech among others.